By Bertil Aronsson, Torsten Lundström, Ingvar Engström (auth.), Fred W. Vahldiek, Stanley A. Mersol (eds.)
Read or Download Anisotropy in Single-Crystal Refractory Compounds: Proceedings of an International Symposium on Anisotropy in Single-Crystal Refractory Compounds, held on June 13–15, 1967, in Dayton Ohio. Sponsored by the Ceramics and Branch of the air Force Materials La PDF
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Additional info for Anisotropy in Single-Crystal Refractory Compounds: Proceedings of an International Symposium on Anisotropy in Single-Crystal Refractory Compounds, held on June 13–15, 1967, in Dayton Ohio. Sponsored by the Ceramics and Branch of the air Force Materials La
09 E '" ~Z; ... 06 ARGON GAS FLOW • I >< + •• ____________ ~ 3S ____________ ~ ____________ 40 ~ 45 ____________ ~~_ 50 . ATOMIC PERCENT CARBON Fig. 9. Carbon X-ray intensity calibration curve for non-stoichiometric titanium carbide (30 kV). It wa. possible to determine the carbon content independently with a good degree of accuracy in the electron microprobe. Using a series of TiC samples in which the carbon content ranged from 30 to 50 atomic percent, a calibration curve of eRa x-ray intensity aa a function of concentration was prepared (Fig.
Williams, Trans. Metallk. 51(1960)328 APPLICATION OF THE ELECTRON MICROPROBE TO THE STUDY OF REFRACTORY METAL CARBIDES, OXIDES, AND SILICIDES Sheldon H. Moll and George W. Bruno Advanced Metals Research Corporation Burlington, Massachusetts Abstract The electron microprobe has been successfully applied to the study of single crystals of the refractory metal carbides, oxides and silicides. The compositional homogeneity, impurity distribution and stoichiometric range have been examined in both as-grown and thermally treated materials.
A beam of electrons is accelerated with a high potenti~l and focused by means of electro-magnetic lenses to a diameter of about 1 micron at the surface of the specimen to be investigated. As in an x-ray tube the specimen will act as a primary source of x-rays. A continuous or white spectrum is produced as well as fluorescent x-rays characteristic of the elements excited by the electron beam. A chemical analysis of the excited area is afforded by analysis of the characteristic x-ray lines by means of a single crystal x-ray spectrometer.